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ETS-Lindgren 7405 E & H Near Field Probe Set

Manufacturer part number: 7405
Consists of three loop probes, one stub and one ball probe, an extension handle, an optional battery-powered preamplifier, and a foam-lined carrying case with a manual and application note. The handle of each probe terminates in a BNC connector. Probes are designed to be used with a signal analyzing device such as an oscilloscope or spectrum analyzer. The optional preamplifier is useful when signal amplification is necessary for the analyzing device.
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The ETS-Lindgren (EMCO) 7405 E & H Near Field Probe Set consists of three loop probes, one stub and one ball probe, an extension handle, an optional battery-powered preamplifier, and a foam-lined carrying case with a manual and application note. The handle of each probe terminates in a BNC connector. Probes are designed to be used with a signal analyzing devices such as an oscilloscope or spectrum analyzer. The optional preamplifier is useful when signal amplification is necessary for the analyzing device.

ETS-Lindgren (EMCO) 7405 is a passive, near field probe set designed as a diagnostic aid for locating and characterizing sources of E and H-Field emissions. The set consists of three loop probes, one stub and one ball probe, an extension handle, an optional battery-powered preamplifier, and a foam-lined carrying case with a manual and application note.

The handle of each probe terminates in a BNC connector. Probes are designed to be used with a signal analyzing devices such as an oscilloscope or spectrum analyzer. The optional preamplifier is useful when signal amplification is necessary for the analyzing device. The loop probes are H-Field selective and directional.

Sensitivity is relative to loop diameter. For example, the 6 cm loop can be used to make a general survey for H-Field emissions, while the smaller diameter loops can isolate specific sources. The ball and stub probes are E-Field selective and Omni-directional. The stub probe is designed for precise E-Field source locations, such as signal traces or IC pins. The ball probe has a large sensing element and is capable of locating weaker signals.

Typical applications for the ETS-Lindgren (EMCO) 7405 Near Field Probe Set include locating and characterizing emissions from PCB’s, IC’s, etch runs, cables, cover seams, etc.

Nominal Gain of Optional Preamplifier​​

​Frequency​Gain
​100 kHz​35.5 dB
​1 MHz​38.1 dB
​100 MHz​37.2 dB
​1 GHz​32.5 dB
​2 GHz​25.0 dB
​3 GHz​13.0 dB
​Model 7405​E/H or H/E Rejection​Primary Sensor​Probe Type​Upper Resonant
​901B​41 dB​H-Field​6.0 cm Loop​790.0 MHz
​902B​29 dB​H-Field​3.0 cm Loop​1.5 GHz
​903B​11 dB​​H-Field​1.0 cm Loop​2.3 GHz
​904B​30 dB​​H-Field​3.6 cm Ball​>1.0 GHz
​905B​30 dB​​H-Field​6.0mm Stup Tip​>3.0 GHz
​907B​+12.0 dBm (Typical)​​3.5 dB (Typical)​100 kHz to 3 GHz​+10.0 dBm

Description

The ETS-Lindgren (EMCO) 7405 E & H Near Field Probe Set consists of three loop probes, one stub and one ball probe, an extension handle, an optional battery-powered preamplifier, and a foam-lined carrying case with a manual and application note. The handle of each probe terminates in a BNC connector. Probes are designed to be used with a signal analyzing devices such as an oscilloscope or spectrum analyzer. The optional preamplifier is useful when signal amplification is necessary for the analyzing device.

ETS-Lindgren (EMCO) 7405 is a passive, near field probe set designed as a diagnostic aid for locating and characterizing sources of E and H-Field emissions. The set consists of three loop probes, one stub and one ball probe, an extension handle, an optional battery-powered preamplifier, and a foam-lined carrying case with a manual and application note.

The handle of each probe terminates in a BNC connector. Probes are designed to be used with a signal analyzing devices such as an oscilloscope or spectrum analyzer. The optional preamplifier is useful when signal amplification is necessary for the analyzing device. The loop probes are H-Field selective and directional.

Sensitivity is relative to loop diameter. For example, the 6 cm loop can be used to make a general survey for H-Field emissions, while the smaller diameter loops can isolate specific sources. The ball and stub probes are E-Field selective and Omni-directional. The stub probe is designed for precise E-Field source locations, such as signal traces or IC pins. The ball probe has a large sensing element and is capable of locating weaker signals.

Typical applications for the ETS-Lindgren (EMCO) 7405 Near Field Probe Set include locating and characterizing emissions from PCB’s, IC’s, etch runs, cables, cover seams, etc.