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EN/IEC 61000-4-19 | 4-20

IEC 61000-4-19 is a test standard developed by the International Electrotechnical Commission (IEC) concerning immunity test methods for electronic equipment exposed to conducted, differential mode disturbances and signaling ranging from 2 kHz to 150 kHz at a.c. power ports. The purpose of this standard is to provide an acceptable reference when testing electrical equipment with the application of differential mode disturbances and signaling to a.c. power ports. This standard outlines test waveforms, range of test levels, test equipment, test set-up, test procedures, and verification procedures for testing immunity of electrical equipment operating at a mains supply voltage up to 280 V and a frequency of 50 Hz or 60 Hz when exposed to conducted, differential mode disturbances. Disturbances originating from power electronics and power line communication systems are included in this standard. Emissions ranging in frequency from 2 kHz to 150 kHz usually have both differential mode and common mode components. IEC 61000-4-19 only covers immunity testing for differential mode disturbances and signaling. IEC 61000-4-16 is recommended in order to cover common-mode testing.

IEC 61000-4-20 concerns immunity and emission test methods for electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These include open structures (striplines and electromagnetic pulse simulators) and closed structures (TEM cells). For further classifications, these structures can be labeled as one-, two-, or multi-port TEM waveguides. The frequency range is determined based on the specific testing requirements and TEM waveguide type. IEC 61000-4-20 outlines TEM waveguide characteristics (typical frequency ranges and EUT-size limitations), TEM waveguide validation methods for EMC tests, the EUT (EUT cabinet and cabling) definition, test set-ups, procedures, and requirements for radiated emission and immunity testing in TEM waveguides.

Avalon Test Equipment offers a variety of test equipment to meet both IEC 61000-4-19 and IEC 61000-4-20 requirements. Rent from Avalon and Test With Confidence®.

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Teseq NSG 4060 Low Frequency Immunity Test System

The Teseq NSG 4060 is an EMC immunity test system for the frequency range of 15 Hz - 150 kHz

Teseq NSG 4070-0 RF Conducted Immunity Test System

RF Generator with built-in signal generator and power meter 9kHz to 1GHz. No internal amplifier

Teseq GTEM 250 Test Cell

Test Cell complete with door and fan. 50W max. RF input. Outer dimensions 1.25x0.65x0.45m. Door size 0.20x0.13m. Max. EUT size 0.20x0.20x0.15m.

Teseq DCP 0100A Dual Directional Coupler

Dual Directional Coupler 4 kHz to 1 GHz