IEC 61000-4-19 is a test standard developed by the International Electrotechnical Commission (IEC) concerning immunity test methods for electronic equipment exposed to conducted, differential mode disturbances and signaling ranging from 2 kHz to 150 kHz at a.c. power ports. The purpose of this standard is to provide an acceptable reference when testing electrical equipment with the application of differential mode disturbances and signaling to a.c. power ports. This standard outlines test waveforms, range of test levels, test equipment, test set-up, test procedures, and verification procedures for testing immunity of electrical equipment operating at a mains supply voltage up to 280 V and a frequency of 50 Hz or 60 Hz when exposed to conducted, differential mode disturbances. Disturbances originating from power electronics and power line communication systems are included in this standard. Emissions ranging in frequency from 2 kHz to 150 kHz usually have both differential mode and common mode components. IEC 61000-4-19 only covers immunity testing for differential mode disturbances and signaling. IEC 61000-4-16 is recommended in order to cover common-mode testing.
IEC 61000-4-20 concerns immunity and emission test methods for electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These include open structures (striplines and electromagnetic pulse simulators) and closed structures (TEM cells). For further classifications, these structures can be labeled as one-, two-, or multi-port TEM waveguides. The frequency range is determined based on the specific testing requirements and TEM waveguide type. IEC 61000-4-20 outlines TEM waveguide characteristics (typical frequency ranges and EUT-size limitations), TEM waveguide validation methods for EMC tests, the EUT (EUT cabinet and cabling) definition, test set-ups, procedures, and requirements for radiated emission and immunity testing in TEM waveguides.
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