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IEC 61000-4-6 is a test standard developed by the International Electrotechnical Commission (IEC) for the immunity of electronic equipment to conducted disturbances brought on by radio frequency (RF) fields. This standard pertains to electronic disturbances from RF transmitters within the frequency range of 150 kHz to 80 MHz. An RF conducted interference could be something as simple as setting a wireless device near power cables causing it to couple wirelessly through the line's shielding and creating a disturbance in the equipment. An example of a more complex scenario would be the cable bundles in a car chassis causing the conducted RF to disturb other lines and affect the electronics.  Equipment without at least one conducting wire or cable are excluded from this standard. The goal of IEC 61000-4-6 is to institute an acceptable basis for evaluating the performance of electronic equipment when exposed to conducted disturbances induced by RF that can be accurately reproduced.

Avalon carries a variety of test equipment from top manufacturers (IFI, EM Test, and more) to help meet your test requirements associated with IEC 61000-4-6. Rent from Avalon Test Equipment and Test With Confidence®.

3 Items in Grid 4 Items in Grid List

Teseq NSG 4070-0 RF Conducted Immunity Test System

RF Generator with built-in signal generator and power meter 9kHz to 1GHz. No internal amplifier

Teseq NSG 4070C-80 Compact Immunity Test System

With integrated power amplifier 80 W module 150 kHz–230 MHz

EM Test CWS 500N3 Test Generator

Key applications of the CWS 500N3 are in the automotive and aerospace area. Various international standards and MIL requirements call for magnetic field tests in the low frequency range. Apart from this the automotive industry requires conducted immunity tests with superposed sinusoidal signals on the DC supply voltage (ripple noise). For both applications the CWS 500N3 is the perfect equipment including everything in a single box, necessary for these tests. The CWS 500N3 meets requirements of SAE J1113-2, ISO 11452-8, DO 160D/E Section 18 and MIL-STD-461 D/E/F/G CS101, CS109 and RS101.

EM Test CWS 500N1.4 Test Generator

RF Conducted Immunity Test System

EM Test CWS 500N4 Simulator for Conducted, Common-Mode Disturbances

EM Test CWS 500N4Simulator for conducted, common-mode disturbances, as per IEC 61000-4-16, IEC 61000-4-19 Annex C, 0Hz (DC) to 165kHz

Teseq DCP 0100A Dual Directional Coupler

Dual Directional Coupler 4 kHz to 1 GHz

CE Mark Product Package for IEC/EN 61000-4 Series Compliance

EM Test NX5, Teseq NSG 4070C-80, and 3ctest EDS 16H

EM Test CWS 500N1 Continuous Wave Simulator

EM Test CWS 500N1 Continuous Wave Simulator for IEC 61000-4-6

Pearson 8705C Current Probe

The Pearson 8705C Current Probe for MIL-STD-461 CS114, CS115, CS116 supports a frequency Range 10 kHz to 400 MHz

A.H. Systems CPF-532 Calibration Fixture

offers a frequency range of 10 kHz–400 MHz

Teseq FT 801 Ferrit Tube EM Decoupling Clamp

150 kHz–1 GHz, 35 mm Cable Diameter

Teseq CMAD 20B Common Mode Absorption Device

The Teseq CMAD 20B Common Mode Absorption Device, 1 MHz to 1 GHz, up to 20 mm cable conforms with CISPR 16-1-4, CISPR 16-2-3, CISPR 11

Teseq CMAD 10 Common Mode Absorption Device for CISPR 22

The Teseq CMAD 10 is a Common Mode Absorption Device designed for CISPR 22 and is ideal for testing in GTEM cells