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Keysight/Agilent/HP 83622A Synthesized Sweep Generator

Manufacturer part number: 83622A
2GHz to 20GHz
PURCHASE
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$0.00
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$0.00Configurations
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Available Configurations

OPTIONS
NamePurchase
STEP ATTENUATOR$0.00
INTERNAL MODUALTION GEN$0.00
DELETE FRONT PANEL$0.00
REAR PANEL RF OUTPUT$0.00
FAST PULSE MODULATION$0.00
1HZ CAPABILITY$0.00

The Keysight/Agilent/HP 83622A synthesized sweeper is the standard of excellence for applications requiring the high performance and accuracy of a synthesized source and the speed and versatility of a sweep oscillator. Synthesized broadband frequency coverage and precise 1 Hz frequency resolution (Opt 008) are generated by indirect synthesis, enabling the Keysight 83622A to achieve low single-sideband phase noise performance. It also delivers excellent harmonic performance with harmonics at least 50 dB below the carrier from 2.0 to 20 GHz.

Features:

  • Scan modulation to simulate antenna scan patterns
  • Accurate fixed and swept frequency offset for two-tone measurement
  • User flatness correction for leveling at remote points in the test system
  • General-purpose source for use in the component test, receiver test and for frequency conversion
  • Sweep Modes: Step, List, Ramp
  • Maximum Power: +13 dBm
  • Power Sweep Range: -20 dBm to maximum power
  • Phase Noise (20 GHz at 10 KHz): -76 dBc
  • Max FM Deviation (locked): ±8 MHz
  • Adapter, APC-3.5(F) to N(F)
  • Power Cord
  • Adapter, APC-3.5(F) to APC-3.5(F)
  • CD Manual
Description

The Keysight/Agilent/HP 83622A synthesized sweeper is the standard of excellence for applications requiring the high performance and accuracy of a synthesized source and the speed and versatility of a sweep oscillator. Synthesized broadband frequency coverage and precise 1 Hz frequency resolution (Opt 008) are generated by indirect synthesis, enabling the Keysight 83622A to achieve low single-sideband phase noise performance. It also delivers excellent harmonic performance with harmonics at least 50 dB below the carrier from 2.0 to 20 GHz.

Features:

  • Scan modulation to simulate antenna scan patterns
  • Accurate fixed and swept frequency offset for two-tone measurement
  • User flatness correction for leveling at remote points in the test system
  • General-purpose source for use in the component test, receiver test and for frequency conversion