The 4156A Semiconductor Parameter Analyzer is a Digital sweep parameter and a reliable tester, powerful failure analysis tool, and automated incoming inspection tool all in one package. The 4156A has four built in SMUs (2 VMUs and 2 VSUs). The 4156A extends the current resolution to 1fA and the accuracy of to 20fA. It also utilizes full kelvin remote sensing on each SMU. All measurements are displayed on the color CRT screen and the ability to superimpose stored graphics from the graphics memory for comparison is available. Unit includes HPIB or serial output ports.