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Teseq NSG 3040-IEC Multifunction Burst Generator

Manufacturer part number: NSG-3040-IEC
Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards.
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Available Configurations

Multi-function generator for immunity testing in accordance with EN/IEC 61000-4-4, 5 and 11 consisting of Mainframe NSG 3040, 7” color touch panel display, CWM 3450, FTM 3425, PQM 3403, 260V/16A single-phase CDN, LAN (TCP/IP) interface, cables, traceable calibration certificate. WIN 3000 basic software included.

Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national, and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfill conducted EMC test requirements for CE mark testing, including Combination Wave Surge (4.4 kV), Electrical Fast Transient (EFT) pulses (4.8 kV) and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.

Featuring an innovative modular design, the NSG 3040 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well-proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

Features:

  • Modular, expandable system
  • Surge voltage to 4.4 kV
  • EFT/Burst to 4.8 kV / 1 MHz
  • PQT to 16 A / 270 VAC & DC
  • Easy to use 7“ color touch screen
  • Parameters can be changed while the test is running
  • Wide range of optional test accessories
  • User manual
  • 1 Mains power cable for test system
  • 1 Dummy plug (interlock blind connector)
  • 1 Grounding strip 10 cm
  • 1 EUT power input connector with cable
  • 1 EUT power output connector
  • WIN 3000 C and LAN crossover cable

Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5

  • Pulse voltage (open circuit): ±200 V to 4.4 kV (in 1 V steps)
  • Pulse current (short circuit): ±100 A to 2.2 kA
  • Impedance: 2/12 Ω
  • Polarity: positive / negative / alternate
  • Pulse repetition: 10 s, up to 600 s (in 1 s steps)
  • Test duration: 1 to 9999 pulses, continuous
  • Phase synchronization: asynchronous, synchronous 0 to 359º (in 1º steps)
  • Coupling: external / internal

Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4

  • Pulse amplitude: ±200 V to 4.8 kV (in 1 V steps) - open circuit, ±100 V to 2.4 kV (50 Ω matching system)
  • Burst frequency: 100 Hz to 1000 kHz
  • Polarity: positive / negative / alternate
  • Repetition time: 1 ms to 4200 s (70 min)
  • Burst time: 1 μs to 1999 s, single pulse, continuous
  • Test duration: 1 s to 1000 h
  • Phase synchronization: asynchronous, synchronous 0 to 359º (in 1º steps)
  • Coupling: external / internal

Dips, Interrupts & Variations
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29

  • Dips, Interrupts & Variations: From EUT voltage input to 0 V, 0%
  • Uvar with optional variac: depending on model (VAR 3005)
  • Uvar with step transformer: 0, 40, 70, 80% (INA 650x)
  • Peak inrush current capability: 500 A (at 230 V)
  • Switching times: 1 to 5 μs (100 Ω load)
  • Event time: 20 µs to 1999 s, 1 to 300 cycles or 1 to 3’000 1/10 cycles
  • Test duration: 1 s to 70’000 min, 1 to 99’999 events, continuous
  • Repetition time: 40 μs to 35 min, 1 to 99’999 cycles
  • Phase synchronization: asynchronous, synchronous 0 to 359º (in 1º steps)
  • EN 61000-4-10
  • EN 61000-4-11
  • EN 61000-4-2
  • EN 61000-4-5
  • EN 61000-6-1
  • EN 61000-6-2
  • EN 61643
  • IEC 61000-4-11
  • IEC 61000-4-29
  • IEC 61000-4-4
  • IEC 61000-4-8
  • IEC 61000-4-9
  • ISO 7637

Description

Multi-function generator for immunity testing in accordance with EN/IEC 61000-4-4, 5 and 11 consisting of Mainframe NSG 3040, 7” color touch panel display, CWM 3450, FTM 3425, PQM 3403, 260V/16A single-phase CDN, LAN (TCP/IP) interface, cables, traceable calibration certificate. WIN 3000 basic software included.

Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national, and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfill conducted EMC test requirements for CE mark testing, including Combination Wave Surge (4.4 kV), Electrical Fast Transient (EFT) pulses (4.8 kV) and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.

Featuring an innovative modular design, the NSG 3040 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well-proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

Features:

  • Modular, expandable system
  • Surge voltage to 4.4 kV
  • EFT/Burst to 4.8 kV / 1 MHz
  • PQT to 16 A / 270 VAC & DC
  • Easy to use 7“ color touch screen
  • Parameters can be changed while the test is running
  • Wide range of optional test accessories