Teseq NSG 3060-1 Conducted Immunity Transient Generator
NSG 3060-1: Mainframe NSG 3060 with CWM 3650, RWM 3652 and FTM 3425 including CDN 3061-C61 and PQM 3403 includes WIN 3000 basic software and traceable calibration certificate.
The NSG 3060 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3060 system is designed to fulfill conducted EMC test requirements for CE mark testing and ANSI C62.41, including Combination Wave Surge (6.6 kV), Electrical Fast Transient (EFT) pulses (4.8 kV), Ring Wave (6.6 kV), and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.
Featuring an innovative modular design, the NSG 3060 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.