Automotive Transient Immunity Generators are necessary for testing the susceptibility of automotive components to EMI (electromagnetic interference) to meet conducted electrical disturbance immunity test standards. A surge or drop in the current may cause damage to the electrical components inside a car. The transient generator creates electrical transient pulses or waveforms that simulate issues that can occur while in use.
Avalon Test Equipment carries a wide variety of transient generators from top manufacturers (Teseq, EM Test,R&S, and more) to meet your testing requirements, available for rent or purchase. We even offer anEM Test Automotive Surge System that conveniently contains all the equipment you need for ISO 7637-2.
The EM Test PFS 200N30 automotive power fail simulator for voltage dips and interruptions is used to comply with standard requirements including ISO 16750-2, mainly from vehicle manufacturers, to perform fast voltage dips ad drops (micro-interruptions). Some standards specify very fast rise and fall times below 1 microsecond an electronic switch.
Key applications of the CWS 500N3 are in the automotive and aerospace area. Various international standards and MIL requirements call for magnetic field tests in the low frequency range. Apart from this the automotive industry requires conducted immunity tests with superposed sinusoidal signals on the DC supply voltage (ripple noise). For both applications the CWS 500N3 is the perfect equipment including everything in a single box, necessary for these tests. The CWS 500N3 meets requirements of SAE J1113-2, ISO 11452-8, DO 160D/E Section 18 and MIL-STD-461 D/E/F/G CS101, CS109 and RS101.
The PFS 200N Series Automotive Power Fail simulator is used to comply with standard requirements, mainly from vehicle manufacturers, to perform fast voltage dips ad drops (micro-interruptions). Some standards specify very fast rise and fall times below 1 microsecond an electronic switch.
The EM Test PFM 200N100.1 has been designed to fully meet the requirements for E10, E13 and E14 of the LV 124 and the E48-09 of the LV 148. It also allows to perform microinterruptions with fast rise/fall time of as low as 200ns as required by GMW 3172, sec. 9.2.18